TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_25_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-008-007-05 | FUSED_ID : 6359364768387596405
  IC_TEMP : -107.14 | VDDM : 1119.90 | AUX_INT :  -12.97 | CsaBias :   33.97
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.63981e-03 / 2
  ADC_P0  : -1.29730e-02 ± 3.49128e-02
  ADC_P1  : 9.42458e-03 ± 9.43295e-04
  ADC_P2  : -7.24120e-06 ± 5.12855e-06
  CSA_Chi2/NDF : 8.97825e-05 / 2
  CSA_P0  : 5.90542e-02 ± 6.32002e-03
  CSA_P1  : 1.03818e-02 ± 4.76168e-04
  CSA_P2  : -8.03097e-05 ± 7.25147e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [35, 36, 71, 75, 79, 84, 98, 108, 114]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [5, 29, 30, 46, 52, 53, 71]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3177', '1.800', '0.1475', '1.799', '0.1035', '7.000', '0.7069', 1, 1, 1, 1, 1724768706.599916]
VI_after__Init : ['1.201', '0.3214', '1.800', '0.1490', '1.800', '0.0975', '7.000', '0.7069', 1, 1, 1, 1, 1724768714.7714458]
VI_at__the_End : ['1.202', '0.3930', '1.800', '0.1323', '1.800', '0.1232', '7.000', '0.7075', 1, 1, 1, 1, 1724768777.1768146]