TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_26_42
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-008-008-05 | FUSED_ID : 6359364768387596421
  IC_TEMP : -114.56 | VDDM : 1119.34 | AUX_INT :  -14.01 | CsaBias :   33.45
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.74527e-03 / 2
  ADC_P0  : -1.40144e-02 ± 3.54766e-02
  ADC_P1  : 9.53626e-03 ± 9.34715e-04
  ADC_P2  : -8.84381e-06 ± 4.94539e-06
  CSA_Chi2/NDF : 7.37070e-05 / 2
  CSA_P0  : 5.82764e-02 ± 5.72634e-03
  CSA_P1  : 1.01522e-02 ± 4.31438e-04
  CSA_P2  : -7.93440e-05 ± 6.57029e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [5, 11, 14, 21, 25, 74, 86]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [3, 9, 27, 32, 51, 70, 124]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3128', '1.800', '0.1491', '1.800', '0.1034', '7.000', '0.7069', 1, 1, 1, 1, 1724768802.275884]
VI_after__Init : ['1.202', '0.3195', '1.800', '0.1512', '1.800', '0.0977', '7.000', '0.7070', 1, 1, 1, 1, 1724768810.2452035]
VI_at__the_End : ['1.201', '0.3804', '1.800', '0.1302', '1.803', '0.1247', '7.000', '0.7073', 1, 1, 1, 1, 1724768869.516767]