TEST_NAME : Wafer
TEST_DATE : 24_08_27-16_49_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-008-022-02 | FUSED_ID : 6359364768387596642
  IC_TEMP :  -65.61 | VDDM : 1118.51 | AUX_INT :   -8.96 | CsaBias :   58.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.35103e-03 / 2
  ADC_P0  : -8.96141e-03 ± 2.48867e-02
  ADC_P1  : 8.44978e-03 ± 6.08852e-04
  ADC_P2  : -6.22203e-06 ± 2.95522e-06
  CSA_Chi2/NDF : 1.50172e-04 / 2
  CSA_P0  : 5.90516e-02 ± 8.17366e-03
  CSA_P1  : 1.00417e-02 ± 6.15827e-04
  CSA_P2  : -5.47591e-05 ± 9.37831e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [17, 30, 42, 50, 58, 76, 105, 109, 114, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [6, 88, 90]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4282', '1.800', '0.1195', '1.800', '0.0985', '7.000', '0.7072', 1, 1, 1, 1, 1724770145.8074422]
VI_after__Init : ['1.201', '0.4289', '1.800', '0.1202', '1.800', '0.0926', '7.000', '0.7072', 1, 1, 1, 1, 1724770153.9308379]
VI_at__the_End : ['1.201', '0.4700', '1.800', '0.1351', '1.801', '0.1177', '7.000', '0.7077', 1, 1, 1, 1, 1724770221.3387802]