TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_35_25
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-009-004-08 | FUSED_ID : 6359364768387600456
  IC_TEMP :  -78.31 | VDDM : 1123.04 | AUX_INT :  -10.50 | CsaBias :   51.29
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.74206e-03 / 2
  ADC_P0  : -1.04986e-02 ± 2.82976e-02
  ADC_P1  : 8.87313e-03 ± 7.25312e-04
  ADC_P2  : -6.61739e-06 ± 3.71092e-06
  CSA_Chi2/NDF : 1.74283e-04 / 2
  CSA_P0  : 5.86237e-02 ± 8.80543e-03
  CSA_P1  : 1.09684e-02 ± 6.63425e-04
  CSA_P2  : -7.24729e-05 ± 1.01032e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [1, 59, 69, 71, 91, 104]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [28, 53, 72, 89, 90, 94, 108, 121]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2818', '1.800', '0.1544', '1.800', '0.0976', '7.000', '0.7072', 1, 1, 1, 1, 1724772924.7822692]
VI_after__Init : ['1.201', '0.2820', '1.800', '0.1546', '1.800', '0.0915', '7.000', '0.7069', 1, 1, 1, 1, 1724772932.911679]
VI_at__the_End : ['1.201', '0.4568', '1.800', '0.1377', '1.799', '0.1216', '7.000', '0.7078', 1, 1, 1, 1, 1724772999.7377825]