TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_33_48
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-009-005-08 | FUSED_ID : 6359364768387600472
  IC_TEMP :  -63.13 | VDDM : 1134.01 | AUX_INT :   -8.55 | CsaBias :   66.27
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.20729e-03 / 2
  ADC_P0  : -8.54770e-03 ± 2.35580e-02
  ADC_P1  : 8.35982e-03 ± 5.83271e-04
  ADC_P2  : -5.25302e-06 ± 2.87659e-06
  CSA_Chi2/NDF : 1.39529e-04 / 2
  CSA_P0  : 5.79494e-02 ± 7.87869e-03
  CSA_P1  : 9.91352e-03 ± 5.93602e-04
  CSA_P2  : -5.05887e-05 ± 9.03986e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [5, 10, 20, 29, 35, 59, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [38, 73, 76, 102, 104, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2652', '1.800', '0.1629', '1.800', '0.0870', '7.000', '0.7070', 1, 1, 1, 1, 1724772828.4533575]
VI_after__Init : ['1.201', '0.2653', '1.800', '0.1625', '1.800', '0.0812', '7.000', '0.7069', 1, 1, 1, 1, 1724772836.444729]
VI_at__the_End : ['1.201', '0.4769', '1.800', '0.1372', '1.800', '0.1163', '7.000', '0.7076', 1, 1, 1, 1, 1724772897.8111508]