TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_30_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-009-007-08 | FUSED_ID : 6359364768387600504
  IC_TEMP :  -72.52 | VDDM : 1121.34 | AUX_INT :   -7.99 | CsaBias :   44.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.00340e-03 / 2
  ADC_P0  : -7.98888e-03 ± 2.14014e-02
  ADC_P1  : 8.85632e-03 ± 5.47675e-04
  ADC_P2  : -7.03999e-06 ± 2.77426e-06
  CSA_Chi2/NDF : 1.88711e-04 / 2
  CSA_P0  : 5.79775e-02 ± 9.16265e-03
  CSA_P1  : 1.05993e-02 ± 6.90339e-04
  CSA_P2  : -6.74527e-05 ± 1.05131e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [3, 14, 20, 28, 53, 66, 68, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 20, 32, 33, 39, 73, 100]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2677', '1.800', '0.1605', '1.800', '0.0907', '7.000', '0.7070', 1, 1, 1, 1, 1724772636.6493874]
VI_after__Init : ['1.201', '0.2673', '1.800', '0.1607', '1.800', '0.0846', '7.000', '0.7069', 1, 1, 1, 1, 1724772644.71974]
VI_at__the_End : ['1.201', '0.4543', '1.800', '0.1361', '1.800', '0.1196', '7.000', '0.7078', 1, 1, 1, 1, 1724772710.2948234]