TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_27_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-009-009-08 | FUSED_ID : 6359364768387600536
  IC_TEMP :  -67.73 | VDDM : 1127.24 | AUX_INT :   -6.64 | CsaBias :   60.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.20368e-04 / 2
  ADC_P0  : -6.63531e-03 ± 1.93844e-02
  ADC_P1  : 8.39710e-03 ± 4.83488e-04
  ADC_P2  : -5.58610e-06 ± 2.38375e-06
  CSA_Chi2/NDF : 1.67474e-04 / 2
  CSA_P0  : 5.85222e-02 ± 8.63171e-03
  CSA_P1  : 9.91396e-03 ± 6.50337e-04
  CSA_P2  : -5.37973e-05 ± 9.90386e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [2, 7, 67, 70, 109]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [27, 50, 61, 65, 66, 92, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2875', '1.800', '0.1494', '1.800', '0.0934', '7.000', '0.7070', 1, 1, 1, 1, 1724772443.4754338]
VI_after__Init : ['1.201', '0.2876', '1.800', '0.1495', '1.800', '0.0875', '7.000', '0.7072', 1, 1, 1, 1, 1724772452.2786582]
VI_at__the_End : ['1.201', '0.4652', '1.800', '0.1372', '1.800', '0.1188', '7.000', '0.7076', 1, 1, 1, 1, 1724772518.4514987]