TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_25_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-009-010-08 | FUSED_ID : 6359364768387600552
  IC_TEMP :  -62.38 | VDDM : 1124.20 | AUX_INT :   -8.65 | CsaBias :   65.08
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25228e-03 / 2
  ADC_P0  : -8.65499e-03 ± 2.39771e-02
  ADC_P1  : 8.24236e-03 ± 5.79680e-04
  ADC_P2  : -5.47761e-06 ± 2.78610e-06
  CSA_Chi2/NDF : 1.27290e-04 / 2
  CSA_P0  : 5.65205e-02 ± 7.52522e-03
  CSA_P1  : 9.72145e-03 ± 5.66971e-04
  CSA_P2  : -5.01143e-05 ± 8.63430e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [29, 79, 99, 111, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [7, 19, 22, 25, 84, 117, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1153', '1.800', '0.1539', '1.800', '0.0894', '7.000', '0.7078', 1, 1, 1, 1, 1724772347.6017609]
VI_after__Init : ['1.202', '0.1154', '1.800', '0.1540', '1.800', '0.0819', '7.000', '0.7069', 1, 1, 1, 1, 1724772355.5442615]
VI_at__the_End : ['1.202', '0.4662', '1.800', '0.1363', '1.800', '0.1181', '7.000', '0.7076', 1, 1, 1, 1, 1724772422.7630281]