TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_14_41
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-009-017-15 | FUSED_ID : 6359364768387600671
  IC_TEMP :  -65.90 | VDDM : 1126.48 | AUX_INT :   -8.36 | CsaBias :   59.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.30365e-03 / 2
  ADC_P0  : -8.36056e-03 ± 2.44737e-02
  ADC_P1  : 8.55939e-03 ± 6.14675e-04
  ADC_P2  : -6.02392e-06 ± 3.05928e-06
  CSA_Chi2/NDF : 1.57433e-04 / 2
  CSA_P0  : 5.96284e-02 ± 8.36894e-03
  CSA_P1  : 1.01632e-02 ± 6.30539e-04
  CSA_P2  : -5.64806e-05 ± 9.60236e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [36, 52, 67, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [4, 17, 25, 36, 55, 64, 71, 73]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2855', '1.800', '0.1617', '1.800', '0.0937', '7.000', '0.7070', 1, 1, 1, 1, 1724771681.6357117]
VI_after__Init : ['1.201', '0.2855', '1.800', '0.1616', '1.800', '0.0878', '7.000', '0.7071', 1, 1, 1, 1, 1724771689.6850615]
VI_at__the_End : ['1.201', '0.4714', '1.800', '0.1391', '1.800', '0.1189', '7.000', '0.7078', 1, 1, 1, 1, 1724771751.4472554]