TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_46_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-006-06 | FUSED_ID : 6359364768387604582
  IC_TEMP :  -60.88 | VDDM : 1120.49 | AUX_INT :   -8.54 | CsaBias :   71.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.37197e-03 / 2
  ADC_P0  : -8.54053e-03 ± 2.51430e-02
  ADC_P1  : 8.09042e-03 ± 6.04079e-04
  ADC_P2  : -4.92875e-06 ± 2.88569e-06
  CSA_Chi2/NDF : 1.57441e-04 / 2
  CSA_P0  : 5.81425e-02 ± 8.36916e-03
  CSA_P1  : 9.71105e-03 ± 6.30556e-04
  CSA_P2  : -4.87052e-05 ± 9.60262e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [48, 55, 56, 63, 81, 87, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [36, 59, 64, 71, 119, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2389', '1.800', '0.1412', '1.800', '0.0863', '7.000', '0.7069', 1, 1, 1, 1, 1724773589.9805515]
VI_after__Init : ['1.201', '0.2390', '1.800', '0.1413', '1.800', '0.0810', '7.000', '0.7072', 1, 1, 1, 1, 1724773598.1128943]
VI_at__the_End : ['1.201', '0.4699', '1.800', '0.1329', '1.800', '0.1185', '7.000', '0.7075', 1, 1, 1, 1, 1724773664.9947295]