TEST_NAME : Wafer
TEST_DATE : 24_08_27-17_59_19
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-014-06 | FUSED_ID : 6359364768387604710
  IC_TEMP :  -62.21 | VDDM : 1136.91 | AUX_INT :   -6.48 | CsaBias :   54.24
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.17285e-04 / 2
  ADC_P0  : -6.47628e-03 ± 1.80947e-02
  ADC_P1  : 8.71794e-03 ± 4.64046e-04
  ADC_P2  : -6.39303e-06 ± 2.35080e-06
  CSA_Chi2/NDF : 1.90965e-04 / 2
  CSA_P0  : 5.93066e-02 ± 9.21721e-03
  CSA_P1  : 1.07040e-02 ± 6.94450e-04
  CSA_P2  : -6.10185e-05 ± 1.05757e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [25, 39, 82, 89, 90]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [1, 19, 60, 62]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.5032', '1.800', '0.1435', '1.800', '0.0972', '7.000', '0.7067', 1, 1, 1, 1, 1724774359.4878633]
VI_after__Init : ['1.201', '0.5041', '1.800', '0.1437', '1.800', '0.0913', '7.000', '0.7071', 1, 1, 1, 1, 1724774367.6552663]
VI_at__the_End : ['1.201', '0.4889', '1.800', '0.1412', '1.808', '0.1145', '7.000', '0.7078', 1, 1, 1, 1, 1724774435.9100366]