TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_02_31
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-016-01 | FUSED_ID : 6359364768387604737
  IC_TEMP :  -57.54 | VDDM : 1129.72 | AUX_INT :   -7.39 | CsaBias :   62.62
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.33658e-04 / 2
  ADC_P0  : -7.38863e-03 ± 2.06609e-02
  ADC_P1  : 8.80480e-03 ± 5.31738e-04
  ADC_P2  : -6.63918e-06 ± 2.70674e-06
  CSA_Chi2/NDF : 1.44954e-04 / 2
  CSA_P0  : 6.04763e-02 ± 8.03041e-03
  CSA_P1  : 1.05030e-02 ± 6.05033e-04
  CSA_P2  : -5.67402e-05 ± 9.21394e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [48, 58, 112]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [33, 79, 88, 118, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3306', '1.800', '0.1686', '1.800', '0.0957', '7.000', '0.7077', 1, 1, 1, 1, 1724774550.635288]
VI_after__Init : ['1.201', '0.3308', '1.800', '0.1687', '1.799', '0.0882', '7.000', '0.7070', 1, 1, 1, 1, 1724774558.6516368]
VI_at__the_End : ['1.201', '0.4928', '1.800', '0.1387', '1.800', '0.1149', '7.000', '0.7077', 1, 1, 1, 1, 1724774617.7641385]