TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_04_07
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-017-01 | FUSED_ID : 6359364768387604753
  IC_TEMP :  -53.02 | VDDM : 1129.12 | AUX_INT :   -8.19 | CsaBias :   73.63
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.39185e-03 / 2
  ADC_P0  : -8.18648e-03 ± 2.53265e-02
  ADC_P1  : 8.23381e-03 ± 6.18974e-04
  ADC_P2  : -5.23167e-06 ± 2.99966e-06
  CSA_Chi2/NDF : 1.22058e-04 / 2
  CSA_P0  : 5.95528e-02 ± 7.36895e-03
  CSA_P1  : 1.01265e-02 ± 5.55197e-04
  CSA_P2  : -5.07458e-05 ± 8.45500e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [18, 31, 65, 67, 85, 115, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [37, 55, 62, 90, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2900', '1.800', '0.1453', '1.799', '0.0822', '7.000', '0.7070', 1, 1, 1, 1, 1724774646.548952]
VI_after__Init : ['1.201', '0.2903', '1.800', '0.1453', '1.800', '0.0768', '7.000', '0.7070', 1, 1, 1, 1, 1724774655.3922293]
VI_at__the_End : ['1.201', '0.4930', '1.800', '0.1370', '1.800', '0.1119', '7.000', '0.7079', 1, 1, 1, 1, 1724774714.3927603]