TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_10_30
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-021-01 | FUSED_ID : 6359364768387604817
  IC_TEMP :  -63.40 | VDDM : 1122.63 | AUX_INT :   -9.27 | CsaBias :   74.70
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25975e-03 / 2
  ADC_P0  : -9.26760e-03 ± 2.39766e-02
  ADC_P1  : 8.46409e-03 ± 5.78324e-04
  ADC_P2  : -6.69346e-06 ± 2.76821e-06
  CSA_Chi2/NDF : 1.69581e-04 / 2
  CSA_P0  : 5.86641e-02 ± 8.68583e-03
  CSA_P1  : 1.01176e-02 ± 6.54414e-04
  CSA_P2  : -5.31341e-05 ± 9.96596e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [33, 66, 68, 86, 90, 100]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [41, 48, 74, 85]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.1637', '1.800', '0.1349', '1.800', '0.0891', '7.000', '0.7079', 1, 1, 1, 1, 1724775030.3863134]
VI_after__Init : ['1.202', '0.1637', '1.800', '0.1349', '1.802', '0.0817', '7.000', '0.7068', 1, 1, 1, 1, 1724775038.5656989]
VI_at__the_End : ['1.201', '0.4831', '1.800', '0.1378', '1.799', '0.1171', '7.000', '0.7075', 1, 1, 1, 1, 1724775099.409934]