TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_12_06
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-010-022-01 | FUSED_ID : 6359364768387604833
  IC_TEMP :  -56.19 | VDDM : 1128.61 | AUX_INT :   -7.12 | CsaBias :   75.33
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.88819e-04 / 2
  ADC_P0  : -7.12063e-03 ± 2.01486e-02
  ADC_P1  : 8.30574e-03 ± 4.88039e-04
  ADC_P2  : -6.04455e-06 ± 2.33431e-06
  CSA_Chi2/NDF : 1.01379e-04 / 2
  CSA_P0  : 5.77130e-02 ± 6.71579e-03
  CSA_P1  : 9.61609e-03 ± 5.05986e-04
  CSA_P2  : -4.38135e-05 ± 7.70558e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [31, 37, 89, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [15, 58, 61, 62, 85, 88, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2016', '1.800', '0.1429', '1.800', '0.0849', '7.000', '0.7069', 1, 1, 1, 1, 1724775125.9738944]
VI_after__Init : ['1.202', '0.2016', '1.800', '0.1429', '1.800', '0.0791', '7.000', '0.7069', 1, 1, 1, 1, 1724775134.7782698]
VI_at__the_End : ['1.202', '0.4862', '1.800', '0.1338', '1.801', '0.1150', '7.000', '0.7076', 1, 1, 1, 1, 1724775197.6933765]