TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_51_57
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-008-11 | FUSED_ID : 6359364768387608715
  IC_TEMP :  -50.28 | VDDM : 1121.78 | AUX_INT :   -9.93 | CsaBias :   64.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.72817e-03 / 2
  ADC_P0  : -9.92869e-03 ± 2.82378e-02
  ADC_P1  : 8.34044e-03 ± 6.93294e-04
  ADC_P2  : -5.30486e-06 ± 3.39781e-06
  CSA_Chi2/NDF : 1.19890e-04 / 2
  CSA_P0  : 6.03547e-02 ± 7.30322e-03
  CSA_P1  : 1.00768e-02 ± 5.50245e-04
  CSA_P2  : -5.05995e-05 ± 8.37958e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [4, 9, 36, 40, 76, 101, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [7, 49, 60, 99, 114, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  A ASIC READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2603', '1.800', '0.1884', '1.800', '0.0906', '7.000', '0.7069', 1, 1, 1, 1, 1724777517.1275246]
VI_after__Init : ['1.201', '0.2602', '1.800', '0.1883', '1.800', '0.0850', '7.000', '0.7069', 1, 1, 1, 1, 1724777525.245972]
VI_at__the_End : ['1.201', '0.4914', '1.800', '0.1398', '1.800', '0.1132', '7.000', '0.7076', 1, 1, 1, 1, 1724777586.695364]