TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_39_10
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-016-12 | FUSED_ID : 6359364768387608844
  IC_TEMP :  -60.19 | VDDM : 1133.79 | AUX_INT :   -8.37 | CsaBias :   69.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.24914e-03 / 2
  ADC_P0  : -8.37282e-03 ± 2.39807e-02
  ADC_P1  : 8.67755e-03 ± 6.19495e-04
  ADC_P2  : -5.52119e-06 ± 3.18548e-06
  CSA_Chi2/NDF : 1.65289e-04 / 2
  CSA_P0  : 6.20886e-02 ± 8.57520e-03
  CSA_P1  : 1.05311e-02 ± 6.46080e-04
  CSA_P2  : -5.69429e-05 ± 9.83903e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [5, 14, 43, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [13, 14, 18, 35, 66, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3096', '1.800', '0.1974', '1.799', '0.0908', '7.000', '0.7069', 1, 1, 1, 1, 1724776750.151132]
VI_after__Init : ['1.201', '0.3096', '1.800', '0.1971', '1.800', '0.0858', '7.000', '0.7069', 1, 1, 1, 1, 1724776758.2253988]
VI_at__the_End : ['1.201', '0.4949', '1.800', '0.1435', '1.808', '0.1139', '7.000', '0.7076', 1, 1, 1, 1, 1724776821.0149384]