TEST_NAME : Wafer
TEST_DATE : 24_08_27-18_29_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-011-022-12 | FUSED_ID : 6359364768387608940
  IC_TEMP :  -59.80 | VDDM : 1132.01 | AUX_INT :   -8.09 | CsaBias :   59.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.10798e-03 / 2
  ADC_P0  : -8.08669e-03 ± 2.25276e-02
  ADC_P1  : 8.52683e-03 ± 5.60736e-04
  ADC_P2  : -6.17439e-06 ± 2.76456e-06
  CSA_Chi2/NDF : 1.69766e-04 / 2
  CSA_P0  : 6.01685e-02 ± 8.69057e-03
  CSA_P1  : 1.06138e-02 ± 6.54772e-04
  CSA_P2  : -5.69485e-05 ± 9.97140e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  9
 | N_BROKEN_FAST :  [29, 52, 55, 63, 87, 92, 103, 108, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [7, 26, 40, 84, 97]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1337', '1.800', '0.1746', '1.800', '0.0887', '7.000', '0.7081', 1, 1, 1, 1, 1724776175.462231]
VI_after__Init : ['1.201', '0.1336', '1.800', '0.1746', '1.801', '0.0812', '7.000', '0.7069', 1, 1, 1, 1, 1724776184.3515508]
VI_at__the_End : ['1.202', '0.4982', '1.800', '0.1387', '1.800', '0.1151', '7.000', '0.7076', 1, 1, 1, 1, 1724776245.1447499]