TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_06_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-012-004-03 | FUSED_ID : 6359364768387612739
  IC_TEMP :  -55.01 | VDDM : 1127.97 | AUX_INT :   -9.83 | CsaBias :   77.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.66111e-03 / 2
  ADC_P0  : -9.82639e-03 ± 2.76451e-02
  ADC_P1  : 8.83915e-03 ± 7.10237e-04
  ADC_P2  : -6.51230e-06 ± 3.63047e-06
  CSA_Chi2/NDF : 1.89310e-04 / 2
  CSA_P0  : 5.89305e-02 ± 9.17718e-03
  CSA_P1  : 1.02739e-02 ± 6.91435e-04
  CSA_P2  : -5.19406e-05 ± 1.05297e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  0
 | N_BROKEN_FAST :  []
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [3, 14, 36, 42, 53, 59, 62, 88, 100, 101, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3029', '1.800', '0.1850', '1.805', '0.0989', '7.000', '0.7076', 1, 1, 1, 1, 1724778372.6102562]
VI_after__Init : ['1.202', '0.3030', '1.800', '0.1850', '1.808', '0.0913', '7.000', '0.7068', 1, 1, 1, 1, 1724778380.7277138]
VI_at__the_End : ['1.201', '0.4972', '1.800', '0.1436', '1.800', '0.1118', '7.000', '0.7076', 1, 1, 1, 1, 1724778448.2486117]