TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_17_18
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-012-011-03 | FUSED_ID : 6359364768387612851
  IC_TEMP :  -53.10 | VDDM : 1134.76 | AUX_INT :   -5.87 | CsaBias :   61.79
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 8.01829e-04 / 2
  ADC_P0  : -5.87408e-03 ± 1.91857e-02
  ADC_P1  : 8.50092e-03 ± 4.91499e-04
  ADC_P2  : -5.36422e-06 ± 2.48556e-06
  CSA_Chi2/NDF : 1.17694e-04 / 2
  CSA_P0  : 6.32159e-02 ± 7.23601e-03
  CSA_P1  : 1.00049e-02 ± 5.45181e-04
  CSA_P2  : -4.85718e-05 ± 8.30247e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [8, 12, 46, 89, 110, 116, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [14, 42, 52, 79, 99, 111]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3226', '1.800', '0.1917', '1.800', '0.0887', '7.000', '0.7065', 1, 1, 1, 1, 1724779038.2892053]
VI_after__Init : ['1.201', '0.3229', '1.800', '0.1918', '1.800', '0.0829', '7.000', '0.7068', 1, 1, 1, 1, 1724779046.4324312]
VI_at__the_End : ['1.201', '0.4969', '1.800', '0.1414', '1.800', '0.1123', '7.000', '0.7075', 1, 1, 1, 1, 1724779112.267312]