TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_18_54
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-012-012-03 | FUSED_ID : 6359364768387612867
  IC_TEMP :  -53.07 | VDDM : 1120.07 | AUX_INT :  -19.71 | CsaBias :   64.43
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 2.14264e-03 / 2
  ADC_P0  : -1.97146e-02 ± 3.20125e-02
  ADC_P1  : 8.47279e-03 ± 7.77730e-04
  ADC_P2  : -5.82837e-06 ± 3.77577e-06
  CSA_Chi2/NDF : 1.66760e-04 / 2
  CSA_P0  : 5.95040e-02 ± 8.61327e-03
  CSA_P1  : 1.02836e-02 ± 6.48948e-04
  CSA_P2  : -5.30671e-05 ± 9.88271e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [67, 80, 107, 114, 118]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 15, 52, 53, 55]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2953', '1.800', '0.1446', '1.799', '0.0905', '7.000', '0.7069', 1, 1, 1, 1, 1724779134.4785776]
VI_after__Init : ['1.201', '0.2955', '1.800', '0.1446', '1.801', '0.0848', '7.000', '0.7066', 1, 1, 1, 1, 1724779142.5059907]
VI_at__the_End : ['1.201', '0.4922', '1.800', '0.1404', '1.800', '0.1132', '7.000', '0.7076', 1, 1, 1, 1, 1724779202.922267]