TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_23_43
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-012-015-03 | FUSED_ID : 6359364768387612915
  IC_TEMP :  -53.90 | VDDM : 1124.00 | AUX_INT :   -6.65 | CsaBias :   76.58
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 7.90798e-04 / 2
  ADC_P0  : -6.64895e-03 ± 1.90379e-02
  ADC_P1  : 8.37606e-03 ± 4.76445e-04
  ADC_P2  : -5.28713e-06 ± 2.36244e-06
  CSA_Chi2/NDF : 1.20412e-04 / 2
  CSA_P0  : 6.12759e-02 ± 7.31909e-03
  CSA_P1  : 1.01656e-02 ± 5.51441e-04
  CSA_P2  : -5.15051e-05 ± 8.39779e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [22, 72, 80, 93, 118, 125, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [26, 63, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3097', '1.800', '0.1633', '1.800', '0.0952', '7.000', '0.7076', 1, 1, 1, 1, 1724779422.691061]
VI_after__Init : ['1.202', '0.3098', '1.800', '0.1633', '1.800', '0.0877', '7.000', '0.7069', 1, 1, 1, 1, 1724779430.7325714]
VI_at__the_End : ['1.201', '0.4918', '1.800', '0.1403', '1.803', '0.1129', '7.000', '0.7075', 1, 1, 1, 1, 1724779499.2781913]