TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_26_55
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-012-017-04 | FUSED_ID : 6359364768387612948
  IC_TEMP :  -59.83 | VDDM : 1122.39 | AUX_INT :   -8.41 | CsaBias :   60.95
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15121e-03 / 2
  ADC_P0  : -8.40736e-03 ± 2.29526e-02
  ADC_P1  : 8.72265e-03 ± 5.80259e-04
  ADC_P2  : -6.69506e-06 ± 2.90643e-06
  CSA_Chi2/NDF : 1.31946e-04 / 2
  CSA_P0  : 5.95877e-02 ± 7.66160e-03
  CSA_P1  : 1.00283e-02 ± 5.77246e-04
  CSA_P2  : -5.31354e-05 ± 8.79078e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [12, 13, 83, 85, 97]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [4, 55, 67, 99]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2377', '1.800', '0.1636', '1.800', '0.0943', '7.000', '0.7076', 1, 1, 1, 1, 1724779614.789263]
VI_after__Init : ['1.202', '0.2376', '1.800', '0.1636', '1.801', '0.0868', '7.000', '0.7069', 1, 1, 1, 1, 1724779622.843603]
VI_at__the_End : ['1.201', '0.4763', '1.800', '0.1391', '1.800', '0.1149', '7.000', '0.7074', 1, 1, 1, 1, 1724779683.0129128]