TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_33_12
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-012-021-04 | FUSED_ID : 6359364768387613012
  IC_TEMP :  -55.03 | VDDM : 1129.76 | AUX_INT :   -7.41 | CsaBias :   58.91
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06790e-03 / 2
  ADC_P0  : -7.41417e-03 ± 2.21190e-02
  ADC_P1  : 8.33814e-03 ± 5.40463e-04
  ADC_P2  : -5.91896e-06 ± 2.60884e-06
  CSA_Chi2/NDF : 1.15017e-04 / 2
  CSA_P0  : 5.80370e-02 ± 7.15325e-03
  CSA_P1  : 1.00770e-02 ± 5.38945e-04
  CSA_P2  : -4.97330e-05 ± 8.20750e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [32, 45, 52, 57, 65, 76]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [37, 56, 65, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2140', '1.800', '0.1144', '1.799', '0.0904', '7.000', '0.7069', 1, 1, 1, 1, 1724779992.6591606]
VI_after__Init : ['1.201', '0.2141', '1.800', '0.1144', '1.800', '0.0848', '7.000', '0.7070', 1, 1, 1, 1, 1724780000.7715259]
VI_at__the_End : ['1.202', '0.4909', '1.800', '0.1370', '1.800', '0.1128', '7.000', '0.7075', 1, 1, 1, 1, 1724780061.7478106]