TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_38_00
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-012-024-04 | FUSED_ID : 6359364768387613060
  IC_TEMP :  -57.56 | VDDM : 1124.71 | AUX_INT :   -9.79 | CsaBias :   74.86
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.63684e-03 / 2
  ADC_P0  : -9.79369e-03 ± 2.74135e-02
  ADC_P1  : 8.52933e-03 ± 6.73003e-04
  ADC_P2  : -6.44000e-06 ± 3.28174e-06
  CSA_Chi2/NDF : 1.34686e-04 / 2
  CSA_P0  : 5.98647e-02 ± 7.74075e-03
  CSA_P1  : 1.02721e-02 ± 5.83210e-04
  CSA_P2  : -5.17253e-05 ± 8.88159e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [3, 35, 57, 65, 68, 93, 99]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [1, 8, 17, 44]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2880', '1.800', '0.1377', '1.800', '0.0884', '7.000', '0.7068', 1, 1, 1, 1, 1724780280.1421497]
VI_after__Init : ['1.201', '0.2882', '1.800', '0.1377', '1.800', '0.0829', '7.000', '0.7067', 1, 1, 1, 1, 1724780288.3954215]
VI_at__the_End : ['1.201', '0.4983', '1.800', '0.1390', '1.800', '0.1139', '7.000', '0.7075', 1, 1, 1, 1, 1724780349.234813]