TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_39_36
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-012-025-04 | FUSED_ID : 6359364768387613076
  IC_TEMP :  -53.02 | VDDM : 1124.85 | AUX_INT :   -7.87 | CsaBias :   80.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.36851e-03 / 2
  ADC_P0  : -7.87450e-03 ± 2.51221e-02
  ADC_P1  : 8.06059e-03 ± 6.04799e-04
  ADC_P2  : -4.85618e-06 ± 2.88629e-06
  CSA_Chi2/NDF : 1.07673e-04 / 2
  CSA_P0  : 5.98137e-02 ± 6.92112e-03
  CSA_P1  : 9.78993e-03 ± 5.21456e-04
  CSA_P2  : -4.46004e-05 ± 7.94116e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [4, 5, 45, 49, 54]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [18, 30, 99, 103, 109, 115, 126]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4872', '1.800', '0.1484', '1.799', '0.0985', '7.000', '0.7076', 1, 1, 1, 1, 1724780375.5678563]
VI_after__Init : ['1.201', '0.4874', '1.800', '0.1487', '1.800', '0.0908', '7.000', '0.7069', 1, 1, 1, 1, 1724780383.7381806]
VI_at__the_End : ['1.201', '0.4958', '1.800', '0.1359', '1.800', '0.1100', '7.000', '0.7076', 1, 1, 1, 1, 1724780453.0118349]