TEST_NAME : Wafer
TEST_DATE : 24_08_27-20_14_47
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-013-007-14 | FUSED_ID : 6359364768387616894
  IC_TEMP :  -51.60 | VDDM : 1125.04 | AUX_INT :  -28.62 | CsaBias :   58.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.83890e-03 / 2
  ADC_P0  : -2.86193e-02 ± 3.01139e-02
  ADC_P1  : 8.80197e-03 ± 7.35845e-04
  ADC_P2  : -7.10910e-06 ± 3.57936e-06
  CSA_Chi2/NDF : 1.47355e-04 / 2
  CSA_P0  : 5.87913e-02 ± 8.09663e-03
  CSA_P1  : 1.00056e-02 ± 6.10023e-04
  CSA_P2  : -4.77891e-05 ± 9.28993e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [36, 74, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [6, 16, 27, 29, 44, 74, 83, 84]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3910', '1.800', '0.1305', '1.800', '0.0936', '7.000', '0.7075', 1, 1, 1, 1, 1724782487.0009537]
VI_after__Init : ['1.201', '0.3910', '1.800', '0.1305', '1.800', '0.0862', '7.000', '0.7071', 1, 1, 1, 1, 1724782495.2013032]
VI_at__the_End : ['1.201', '0.4941', '1.800', '0.1373', '1.800', '0.1107', '7.000', '0.7075', 1, 1, 1, 1, 1724782563.012933]