TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_57_11
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-013-018-09 | FUSED_ID : 6359364768387617065
  IC_TEMP :  -57.71 | VDDM : 1131.97 | AUX_INT :   -8.90 | CsaBias :   73.28
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.44436e-03 / 2
  ADC_P0  : -8.89921e-03 ± 2.57885e-02
  ADC_P1  : 8.27115e-03 ± 6.28948e-04
  ADC_P2  : -5.32323e-06 ± 3.05095e-06
  CSA_Chi2/NDF : 1.27411e-04 / 2
  CSA_P0  : 6.13933e-02 ± 7.52881e-03
  CSA_P1  : 9.87386e-03 ± 5.67241e-04
  CSA_P2  : -4.83397e-05 ± 8.63842e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [7, 9, 10, 28, 43, 85, 104, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [13, 37, 71, 80, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3174', '1.800', '0.1634', '1.800', '0.0908', '7.000', '0.7074', 1, 1, 1, 1, 1724781430.9910777]
VI_after__Init : ['1.201', '0.3174', '1.800', '0.1636', '1.800', '0.0835', '7.000', '0.7066', 1, 1, 1, 1, 1724781439.2263987]
VI_at__the_End : ['1.201', '0.4889', '1.800', '0.1395', '1.800', '0.1131', '7.000', '0.7074', 1, 1, 1, 1, 1724781500.6144059]