TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_52_24
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-013-021-09 | FUSED_ID : 6359364768387617113
  IC_TEMP :  -56.91 | VDDM : 1128.42 | AUX_INT :   -7.97 | CsaBias :   69.50
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08536e-03 / 2
  ADC_P0  : -7.97482e-03 ± 2.23113e-02
  ADC_P1  : 8.66270e-03 ± 5.69117e-04
  ADC_P2  : -6.02182e-06 ± 2.88107e-06
  CSA_Chi2/NDF : 1.50724e-04 / 2
  CSA_P0  : 6.17315e-02 ± 8.18867e-03
  CSA_P1  : 1.03357e-02 ± 6.16957e-04
  CSA_P2  : -5.28713e-05 ± 9.39553e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [14, 15, 34, 89, 111]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [42, 84, 88, 104, 117]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2537', '1.800', '0.1595', '1.800', '0.0950', '7.000', '0.7065', 1, 1, 1, 1, 1724781144.008151]
VI_after__Init : ['1.201', '0.2537', '1.800', '0.1595', '1.800', '0.0894', '7.000', '0.7069', 1, 1, 1, 1, 1724781152.0604918]
VI_at__the_End : ['1.201', '0.4974', '1.800', '0.1395', '1.800', '0.1141', '7.000', '0.7074', 1, 1, 1, 1, 1724781220.4335606]