TEST_NAME : Wafer
TEST_DATE : 24_08_27-19_47_35
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-013-024-09 | FUSED_ID : 6359364768387617161
  IC_TEMP :  -55.32 | VDDM : 1123.40 | AUX_INT :   -6.41 | CsaBias :   75.38
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.53087e-04 / 2
  ADC_P0  : -6.41270e-03 ± 2.09342e-02
  ADC_P1  : 8.22908e-03 ± 5.18738e-04
  ADC_P2  : -4.94621e-06 ± 2.54133e-06
  CSA_Chi2/NDF : 9.76142e-05 / 2
  CSA_P0  : 5.90976e-02 ± 6.58990e-03
  CSA_P1  : 9.62368e-03 ± 4.96501e-04
  CSA_P2  : -4.22816e-05 ± 7.56113e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [19, 25, 30]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  10
 | P_BROKEN_FAST :  [0, 5, 20, 46, 54, 57, 62, 63, 70, 113]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3652', '1.800', '0.1304', '1.800', '0.0880', '7.000', '0.7066', 1, 1, 1, 1, 1724780855.1770506]
VI_after__Init : ['1.201', '0.3654', '1.800', '0.1304', '1.800', '0.0825', '7.000', '0.7066', 1, 1, 1, 1, 1724780863.1174648]
VI_at__the_End : ['1.201', '0.4913', '1.800', '0.1382', '1.800', '0.1123', '7.000', '0.7074', 1, 1, 1, 1, 1724780930.334808]