TEST_NAME : Wafer
TEST_DATE : 24_08_27-20_25_45
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-014-005-00 | FUSED_ID : 6359364768387620944
  IC_TEMP :  -57.12 | VDDM : 1129.75 | AUX_INT :   -7.43 | CsaBias :   61.20
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.01444e-04 / 2
  ADC_P0  : -7.43179e-03 ± 2.02947e-02
  ADC_P1  : 8.63057e-03 ± 5.11262e-04
  ADC_P2  : -6.39793e-06 ± 2.54872e-06
  CSA_Chi2/NDF : 1.35238e-04 / 2
  CSA_P0  : 5.79881e-02 ± 7.75662e-03
  CSA_P1  : 1.03892e-02 ± 5.84405e-04
  CSA_P2  : -5.30683e-05 ± 8.89980e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [6, 50, 60, 64, 77, 111, 113]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [11, 22, 44, 59, 84, 101, 104, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2516', '1.800', '0.1490', '1.800', '0.0824', '7.000', '0.7066', 1, 1, 1, 1, 1724783145.2045193]
VI_after__Init : ['1.201', '0.2516', '1.800', '0.1490', '1.800', '0.0766', '7.000', '0.7067', 1, 1, 1, 1, 1724783153.9537487]
VI_at__the_End : ['1.201', '0.4957', '1.800', '0.1409', '1.799', '0.1115', '7.000', '0.7075', 1, 1, 1, 1, 1724783214.6639392]