TEST_NAME : Wafer
TEST_DATE : 24_08_27-20_44_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-014-017-07 | FUSED_ID : 6359364768387621143
  IC_TEMP :  -59.61 | VDDM : 1127.69 | AUX_INT :   -9.82 | CsaBias :   74.46
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.45204e-03 / 2
  ADC_P0  : -9.81760e-03 ± 2.57887e-02
  ADC_P1  : 8.49089e-03 ± 6.29506e-04
  ADC_P2  : -6.34243e-06 ± 3.05808e-06
  CSA_Chi2/NDF : 1.45065e-04 / 2
  CSA_P0  : 6.06667e-02 ± 8.03349e-03
  CSA_P1  : 1.02739e-02 ± 6.05265e-04
  CSA_P2  : -5.23744e-05 ± 9.21748e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [5, 20, 30, 79, 86, 99, 111, 116]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [20, 72, 92]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2446', '1.800', '0.1680', '1.800', '0.0919', '7.000', '0.7066', 1, 1, 1, 1, 1724784291.0580447]
VI_after__Init : ['1.199', '0.2440', '1.800', '0.1679', '1.804', '0.0863', '7.000', '0.7068', 1, 1, 1, 1, 1724784300.0123315]
VI_at__the_End : ['1.201', '0.4948', '1.800', '0.1398', '1.801', '0.1134', '7.000', '0.7075', 1, 1, 1, 1, 1724784368.0900803]