TEST_NAME : Wafer
TEST_DATE : 24_08_27-20_52_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-014-022-07 | FUSED_ID : 6359364768387621223
  IC_TEMP :  -60.84 | VDDM : 1122.56 | AUX_INT :   -9.96 | CsaBias :   71.42
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.69948e-03 / 2
  ADC_P0  : -9.95952e-03 ± 2.79918e-02
  ADC_P1  : 8.18994e-03 ± 6.73371e-04
  ADC_P2  : -5.14952e-06 ± 3.23444e-06
  CSA_Chi2/NDF : 1.52014e-04 / 2
  CSA_P0  : 5.89320e-02 ± 8.22364e-03
  CSA_P1  : 1.00125e-02 ± 6.19592e-04
  CSA_P2  : -5.11120e-05 ± 9.43565e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  3
 | N_BROKEN_FAST :  [5, 18, 96]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [20, 36, 71, 79, 80, 90, 104]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2813', '1.800', '0.1468', '1.800', '0.0907', '7.000', '0.7068', 1, 1, 1, 1, 1724784770.3826733]
VI_after__Init : ['1.202', '0.2792', '1.800', '0.1463', '1.800', '0.0848', '7.000', '0.7066', 1, 1, 1, 1, 1724784778.3931973]
VI_at__the_End : ['1.202', '0.4825', '1.800', '0.1352', '1.799', '0.1120', '7.000', '0.7076', 1, 1, 1, 1, 1724784847.9147139]