TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_32_46
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-015-005-13 | FUSED_ID : 6359364768387625053
  IC_TEMP :  -56.41 | VDDM : 1122.00 | AUX_INT :   -8.24 | CsaBias :   74.71
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.06913e-03 / 2
  ADC_P0  : -8.24055e-03 ± 2.21287e-02
  ADC_P1  : 8.35237e-03 ± 5.41267e-04
  ADC_P2  : -5.74395e-06 ± 2.62969e-06
  CSA_Chi2/NDF : 2.01664e-04 / 2
  CSA_P0  : 5.75467e-02 ± 9.47188e-03
  CSA_P1  : 1.03476e-02 ± 7.13638e-04
  CSA_P2  : -5.42565e-05 ± 1.08679e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [18, 71, 92, 105]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 28, 55, 59, 88, 99, 106]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3844', '1.800', '0.1453', '1.800', '0.0891', '7.000', '0.7073', 1, 1, 1, 1, 1724787166.4410777]
VI_after__Init : ['1.201', '0.3837', '1.800', '0.1453', '1.801', '0.0823', '7.000', '0.7067', 1, 1, 1, 1, 1724787174.4805477]
VI_at__the_End : ['1.201', '0.4910', '1.800', '0.1394', '1.806', '0.1097', '7.000', '0.7076', 1, 1, 1, 1, 1724787243.2720542]