TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_27_59
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-015-008-13 | FUSED_ID : 6359364768387625101
  IC_TEMP :  -48.73 | VDDM : 1129.94 | AUX_INT :   -8.34 | CsaBias :   79.54
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15925e-03 / 2
  ADC_P0  : -8.33572e-03 ± 2.30852e-02
  ADC_P1  : 8.04150e-03 ± 5.51664e-04
  ADC_P2  : -4.77491e-06 ± 2.62579e-06
  CSA_Chi2/NDF : 1.10816e-04 / 2
  CSA_P0  : 5.83744e-02 ± 7.02140e-03
  CSA_P1  : 9.62522e-03 ± 5.29012e-04
  CSA_P2  : -4.27754e-05 ± 8.05623e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [39, 86, 102, 104, 124]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [81, 82, 88, 100, 104, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3551', '1.800', '0.1595', '1.800', '0.0864', '7.000', '0.7072', 1, 1, 1, 1, 1724786878.9280007]
VI_after__Init : ['1.201', '0.3554', '1.800', '0.1595', '1.800', '0.0789', '7.000', '0.7067', 1, 1, 1, 1, 1724786887.2283585]
VI_at__the_End : ['1.201', '0.4925', '1.800', '0.1386', '1.800', '0.1107', '7.000', '0.7073', 1, 1, 1, 1, 1724786955.6821156]