TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_16_52
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-015-015-13 | FUSED_ID : 6359364768387625213
  IC_TEMP :  -55.72 | VDDM : 1129.94 | AUX_INT :   -8.34 | CsaBias :   87.47
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.15925e-03 / 2
  ADC_P0  : -8.33572e-03 ± 2.30852e-02
  ADC_P1  : 8.04150e-03 ± 5.51664e-04
  ADC_P2  : -4.77491e-06 ± 2.62579e-06
  CSA_Chi2/NDF : 1.12723e-04 / 2
  CSA_P0  : 5.79938e-02 ± 7.08157e-03
  CSA_P1  : 9.65548e-03 ± 5.33545e-04
  CSA_P2  : -4.47359e-05 ± 8.12526e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  10
 | N_BROKEN_FAST :  [4, 12, 15, 26, 55, 62, 81, 103, 117, 119]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  4
 | P_BROKEN_FAST :  [0, 36, 53, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1997', '1.800', '0.1542', '1.799', '0.0881', '7.000', '0.7066', 1, 1, 1, 1, 1724786212.0624058]
VI_after__Init : ['1.202', '0.1996', '1.800', '0.1541', '1.801', '0.0824', '7.000', '0.7065', 1, 1, 1, 1, 1724786220.839573]
VI_at__the_End : ['1.202', '0.4854', '1.800', '0.1375', '1.803', '0.1115', '7.000', '0.7073', 1, 1, 1, 1, 1724786285.821765]