TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_10_28
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-015-019-10 | FUSED_ID : 6359364768387625274
  IC_TEMP :  -53.85 | VDDM : 1122.03 | AUX_INT :   -9.84 | CsaBias :   64.73
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.71345e-03 / 2
  ADC_P0  : -9.84295e-03 ± 2.81174e-02
  ADC_P1  : 8.33304e-03 ± 6.90337e-04
  ADC_P2  : -5.24812e-06 ± 3.38332e-06
  CSA_Chi2/NDF : 1.61723e-04 / 2
  CSA_P0  : 5.95141e-02 ± 8.48221e-03
  CSA_P1  : 1.03376e-02 ± 6.39073e-04
  CSA_P2  : -5.39715e-05 ± 9.73232e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [7, 37, 43, 68, 79, 108]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [5, 60, 61, 62, 99, 112]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3072', '1.800', '0.1643', '1.799', '0.0949', '7.000', '0.7066', 1, 1, 1, 1, 1724785827.6659021]
VI_after__Init : ['1.201', '0.3074', '1.800', '0.1644', '1.801', '0.0890', '7.000', '0.7068', 1, 1, 1, 1, 1724785835.802375]
VI_at__the_End : ['1.201', '0.4898', '1.800', '0.1365', '1.805', '0.1146', '7.000', '0.7076', 1, 1, 1, 1, 1724785903.0592847]