TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_08_51
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-015-020-10 | FUSED_ID : 6359364768387625290
  IC_TEMP :  -47.53 | VDDM : 1124.98 | AUX_INT :   -8.70 | CsaBias :   78.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.32400e-03 / 2
  ADC_P0  : -8.70053e-03 ± 2.46978e-02
  ADC_P1  : 7.93338e-03 ± 5.83504e-04
  ADC_P2  : -4.53807e-06 ± 2.74815e-06
  CSA_Chi2/NDF : 8.81432e-05 / 2
  CSA_P0  : 5.85364e-02 ± 6.26205e-03
  CSA_P1  : 9.82677e-03 ± 4.71801e-04
  CSA_P2  : -4.44246e-05 ± 7.18497e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  8
 | N_BROKEN_FAST :  [1, 24, 29, 77, 83, 89, 113, 115]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  2
 | P_BROKEN_FAST :  [16, 20]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3864', '1.800', '0.1219', '1.799', '0.0896', '7.000', '0.7066', 1, 1, 1, 1, 1724785731.4259384]
VI_after__Init : ['1.201', '0.3863', '1.800', '0.1220', '1.800', '0.0840', '7.000', '0.7069', 1, 1, 1, 1, 1724785739.6224236]
VI_at__the_End : ['1.201', '0.4980', '1.800', '0.1394', '1.801', '0.1089', '7.000', '0.7074', 1, 1, 1, 1, 1724785806.6854384]