TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_05_39
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-015-022-10 | FUSED_ID : 6359364768387625322
  IC_TEMP :  -50.41 | VDDM : 1131.63 | AUX_INT :   -7.94 | CsaBias :   81.90
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.25408e-03 / 2
  ADC_P0  : -7.93633e-03 ± 2.39976e-02
  ADC_P1  : 8.22922e-03 ± 5.79560e-04
  ADC_P2  : -5.65905e-06 ± 2.76766e-06
  CSA_Chi2/NDF : 1.14994e-04 / 2
  CSA_P0  : 5.76888e-02 ± 7.15253e-03
  CSA_P1  : 9.70900e-03 ± 5.38892e-04
  CSA_P2  : -4.30789e-05 ± 8.20668e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  15
 | N_BROKEN_FAST :  [5, 9, 11, 19, 30, 31, 56, 64, 77, 79, 86, 90, 94, 108, 125]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  12
 | P_BROKEN_FAST :  [3, 6, 8, 32, 51, 60, 61, 63, 67, 75, 112, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.3161', '1.800', '0.1669', '1.800', '0.0917', '7.000', '0.7067', 1, 1, 1, 1, 1724785538.9739873]
VI_after__Init : ['1.202', '0.3162', '1.800', '0.1670', '1.800', '0.0859', '7.000', '0.7064', 1, 1, 1, 1, 1724785547.0735557]
VI_at__the_End : ['1.202', '0.4970', '1.800', '0.1363', '1.799', '0.1090', '7.000', '0.7076', 1, 1, 1, 1, 1724785614.77755]