TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_02_27
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-015-024-10 | FUSED_ID : 6359364768387625354
  IC_TEMP :  -51.34 | VDDM : 1124.75 | AUX_INT :   -9.63 | CsaBias :   90.02
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.43491e-03 / 2
  ADC_P0  : -9.62524e-03 ± 2.56759e-02
  ADC_P1  : 7.72632e-03 ± 5.80514e-04
  ADC_P2  : -4.70532e-06 ± 2.61982e-06
  CSA_Chi2/NDF : 8.58070e-05 / 2
  CSA_P0  : 5.78256e-02 ± 6.17851e-03
  CSA_P1  : 9.32229e-03 ± 4.65506e-04
  CSA_P2  : -3.79149e-05 ± 7.08911e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [13, 14, 28, 51, 73, 83, 91]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [0, 20, 27, 47, 57, 65, 120]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.0537', '1.800', '0.1408', '1.800', '0.0829', '7.000', '0.7078', 1, 1, 1, 1, 1724785346.4146922]
VI_after__Init : ['1.202', '0.0537', '1.800', '0.1408', '1.799', '0.0756', '7.000', '0.7069', 1, 1, 1, 1, 1724785355.2231526]
VI_at__the_End : ['1.201', '0.4925', '1.800', '0.1322', '1.802', '0.1094', '7.000', '0.7074', 1, 1, 1, 1, 1724785414.761834]