TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_00_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-015-025-10 | FUSED_ID : 6359364768387625370
  IC_TEMP :  -47.17 | VDDM : 1113.44 | AUX_INT :   -7.23 | CsaBias :   86.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.08743e-03 / 2
  ADC_P0  : -7.23261e-03 ± 2.23698e-02
  ADC_P1  : 7.85279e-03 ± 5.26170e-04
  ADC_P2  : -4.55254e-06 ± 2.45144e-06
  CSA_Chi2/NDF : 6.67887e-05 / 2
  CSA_P0  : 5.70774e-02 ± 5.45097e-03
  CSA_P1  : 9.01676e-03 ± 4.10691e-04
  CSA_P2  : -3.22722e-05 ± 6.25434e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  4
 | N_BROKEN_FAST :  [18, 102, 120, 121]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [2, 5, 55, 69, 95, 106, 125]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.4571', '1.800', '0.1457', '1.800', '0.0957', '7.000', '0.7067', 1, 1, 1, 1, 1724785250.0743244]
VI_after__Init : ['1.201', '0.4574', '1.800', '0.1458', '1.800', '0.0900', '7.000', '0.7067', 1, 1, 1, 1, 1724785258.1858165]
VI_at__the_End : ['1.201', '0.4962', '1.800', '0.1349', '1.799', '0.1079', '7.000', '0.7076', 1, 1, 1, 1, 1724785326.8950446]