TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_53_20
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-016-017-02 | FUSED_ID : 6359364768387629330
  IC_TEMP :  -42.17 | VDDM : 1128.89 | AUX_INT :  -16.79 | CsaBias :   78.35
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.55731e-03 / 2
  ADC_P0  : -1.67884e-02 ± 2.72860e-02
  ADC_P1  : 7.98350e-03 ± 6.42721e-04
  ADC_P2  : -4.63539e-06 ± 3.01045e-06
  CSA_Chi2/NDF : 6.38917e-05 / 2
  CSA_P0  : 5.79816e-02 ± 5.33144e-03
  CSA_P1  : 9.49351e-03 ± 4.01685e-04
  CSA_P2  : -3.90144e-05 ± 6.11719e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [0, 44, 51, 57, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  3
 | P_BROKEN_FAST :  [37, 57, 94]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.0540', '1.800', '0.1505', '1.800', '0.0758', '7.000', '0.7065', 1, 1, 1, 1, 1724788400.608954]
VI_after__Init : ['1.201', '0.0540', '1.800', '0.1505', '1.801', '0.0702', '7.000', '0.7065', 1, 1, 1, 1, 1724788408.6944907]
VI_at__the_End : ['1.201', '0.4965', '1.800', '0.1366', '1.804', '0.1078', '7.000', '0.7074', 1, 1, 1, 1, 1724788475.4212625]