TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_54_56
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-016-018-02 | FUSED_ID : 6359364768387629346
  IC_TEMP :  -50.50 | VDDM : 1128.10 | AUX_INT :   -8.02 | CsaBias :   89.22
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 9.40624e-04 / 2
  ADC_P0  : -8.02008e-03 ± 2.07188e-02
  ADC_P1  : 8.17158e-03 ± 4.92301e-04
  ADC_P2  : -5.69706e-06 ± 2.32332e-06
  CSA_Chi2/NDF : 1.29782e-04 / 2
  CSA_P0  : 5.99933e-02 ± 7.59854e-03
  CSA_P1  : 9.82266e-03 ± 5.72495e-04
  CSA_P2  : -4.40446e-05 ± 8.71842e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [12, 56, 66, 78, 88, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [33, 41, 43, 59, 89]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3659', '1.800', '0.1453', '1.799', '0.0933', '7.000', '0.7068', 1, 1, 1, 1, 1724788496.331701]
VI_after__Init : ['1.201', '0.3660', '1.800', '0.1454', '1.801', '0.0877', '7.000', '0.7066', 1, 1, 1, 1, 1724788504.4100525]
VI_at__the_End : ['1.201', '0.4967', '1.800', '0.1375', '1.809', '0.1107', '7.000', '0.7072', 1, 1, 1, 1, 1724788572.9297597]