TEST_NAME : Wafer
TEST_DATE : 24_08_27-21_58_09
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-016-020-02 | FUSED_ID : 6359364768387629378
  IC_TEMP :  -55.37 | VDDM : 1123.95 | AUX_INT :   -8.74 | CsaBias :   65.06
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.26567e-03 / 2
  ADC_P0  : -8.74211e-03 ± 2.41049e-02
  ADC_P1  : 8.24968e-03 ± 5.82771e-04
  ADC_P2  : -5.53245e-06 ± 2.80096e-06
  CSA_Chi2/NDF : 1.35279e-04 / 2
  CSA_P0  : 5.75042e-02 ± 7.75778e-03
  CSA_P1  : 1.01185e-02 ± 5.84493e-04
  CSA_P2  : -4.89947e-05 ± 8.90113e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [5, 18, 44, 45, 94]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [10, 37, 63, 108, 109]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.3205', '1.800', '0.1745', '1.799', '0.0870', '7.000', '0.7075', 1, 1, 1, 1, 1724788688.5028381]
VI_after__Init : ['1.201', '0.3204', '1.800', '0.1745', '1.800', '0.0795', '7.000', '0.7065', 1, 1, 1, 1, 1724788697.3301926]
VI_at__the_End : ['1.201', '0.4981', '1.800', '0.1377', '1.803', '0.1090', '7.000', '0.7076', 1, 1, 1, 1, 1724788757.0025895]