TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_01_21
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-016-022-02 | FUSED_ID : 6359364768387629410
  IC_TEMP :  -56.50 | VDDM : 1117.64 | AUX_INT :   -9.69 | CsaBias :   73.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.70615e-03 / 2
  ADC_P0  : -9.69038e-03 ± 2.80490e-02
  ADC_P1  : 8.34267e-03 ± 6.86428e-04
  ADC_P2  : -5.51438e-06 ± 3.34527e-06
  CSA_Chi2/NDF : 1.45002e-04 / 2
  CSA_P0  : 5.85816e-02 ± 8.03173e-03
  CSA_P1  : 9.94484e-03 ± 6.05133e-04
  CSA_P2  : -4.75886e-05 ± 9.21546e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [17, 29, 64, 121, 126]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  6
 | P_BROKEN_FAST :  [35, 65, 72, 88, 97, 108]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2310', '1.800', '0.1152', '1.800', '0.0816', '7.000', '0.7066', 1, 1, 1, 1, 1724788881.1489093]
VI_after__Init : ['1.200', '0.2310', '1.800', '0.1152', '1.800', '0.0758', '7.000', '0.7067', 1, 1, 1, 1, 1724788889.2173676]
VI_at__the_End : ['1.201', '0.4917', '1.800', '0.1361', '1.807', '0.1125', '7.000', '0.7076', 1, 1, 1, 1, 1724788949.27275]