TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_12_33
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-017-017-15 | FUSED_ID : 6359364768387633439
  IC_TEMP :  -54.70 | VDDM : 1127.77 | AUX_INT :   -8.75 | CsaBias :   87.87
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.27115e-03 / 2
  ADC_P0  : -8.75370e-03 ± 2.41416e-02
  ADC_P1  : 8.11932e-03 ± 5.70265e-04
  ADC_P2  : -5.60699e-06 ± 2.67283e-06
  CSA_Chi2/NDF : 1.05511e-04 / 2
  CSA_P0  : 5.86483e-02 ± 6.85129e-03
  CSA_P1  : 9.76818e-03 ± 5.16195e-04
  CSA_P2  : -4.24840e-05 ± 7.86104e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  5
 | N_BROKEN_FAST :  [3, 44, 60, 65, 123]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  8
 | P_BROKEN_FAST :  [3, 4, 11, 49, 60, 62, 92, 127]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.2404', '1.800', '0.1803', '1.800', '0.0842', '7.000', '0.7065', 1, 1, 1, 1, 1724789553.1365936]
VI_after__Init : ['1.201', '0.2404', '1.800', '0.1802', '1.800', '0.0785', '7.000', '0.7066', 1, 1, 1, 1, 1724789561.23796]
VI_at__the_End : ['1.201', '0.5003', '1.800', '0.1377', '1.799', '0.1098', '7.000', '0.7072', 1, 1, 1, 1, 1724789626.9110124]