TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_39_38
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
------------------------------------------------------------
------------------------------------------------------------
ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-018-015-06 | FUSED_ID : 6359364768387637494
  IC_TEMP :  -61.82 | VDDM : 1122.88 | AUX_INT :   -7.30 | CsaBias :   50.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.02935e-03 / 2
  ADC_P0  : -7.30412e-03 ± 2.17161e-02
  ADC_P1  : 8.32516e-03 ± 5.30620e-04
  ADC_P2  : -5.85367e-06 ± 2.56132e-06
  CSA_Chi2/NDF : 1.50965e-04 / 2
  CSA_P0  : 6.17793e-02 ± 8.19521e-03
  CSA_P1  : 1.00310e-02 ± 6.17450e-04
  CSA_P2  : -5.04742e-05 ± 9.40303e-06
------------------------------------------------------------
ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  6
 | N_BROKEN_FAST :  [44, 54, 68, 74, 75, 102]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  11
 | P_BROKEN_FAST :  [14, 26, 30, 34, 38, 43, 68, 69, 86, 87, 91]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
------------------------------------------------------------
------------------------------------------------------------
VI_before_Init : ['1.201', '0.3921', '1.800', '0.1807', '1.799', '0.0947', '7.000', '0.7064', 1, 1, 1, 1, 1724791178.3928216]
VI_after__Init : ['1.201', '0.3922', '1.800', '0.1808', '1.800', '0.0888', '7.000', '0.7064', 1, 1, 1, 1, 1724791186.5313003]
VI_at__the_End : ['1.201', '0.4879', '1.800', '0.1387', '1.803', '0.1131', '7.000', '0.7071', 1, 1, 1, 1, 1724791248.6694262]