TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_41_14
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-018-016-01 | FUSED_ID : 6359364768387637505
  IC_TEMP :  -54.73 | VDDM : 1122.20 | AUX_INT :   -6.93 | CsaBias :   65.60
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.07840e-03 / 2
  ADC_P0  : -6.93119e-03 ± 2.22995e-02
  ADC_P1  : 8.09906e-03 ± 5.47867e-04
  ADC_P2  : -4.41165e-06 ± 2.66985e-06
  CSA_Chi2/NDF : 1.71272e-04 / 2
  CSA_P0  : 5.82611e-02 ± 8.72901e-03
  CSA_P1  : 9.95787e-03 ± 6.57668e-04
  CSA_P2  : -4.82731e-05 ± 1.00155e-05
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  2
 | N_BROKEN_FAST :  [19, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  9
 | P_BROKEN_FAST :  [3, 28, 46, 54, 72, 84, 109, 113, 114]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.2177', '1.800', '0.1321', '1.799', '0.0817', '7.000', '0.7066', 1, 1, 1, 1, 1724791274.3573153]
VI_after__Init : ['1.201', '0.2177', '1.800', '0.1320', '1.800', '0.0758', '7.000', '0.7063', 1, 1, 1, 1, 1724791282.4108126]
VI_at__the_End : ['1.201', '0.4902', '1.800', '0.1401', '1.804', '0.1107', '7.000', '0.7074', 1, 1, 1, 1, 1724791349.2334414]