TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_42_50
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-018-017-01 | FUSED_ID : 6359364768387637521
  IC_TEMP :  -61.70 | VDDM : 1134.82 | AUX_INT :   -7.82 | CsaBias :   75.18
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.23037e-03 / 2
  ADC_P0  : -7.81694e-03 ± 2.37853e-02
  ADC_P1  : 8.35477e-03 ± 5.88223e-04
  ADC_P2  : -5.50937e-06 ± 2.88187e-06
  CSA_Chi2/NDF : 1.66326e-04 / 2
  CSA_P0  : 5.88125e-02 ± 8.60206e-03
  CSA_P1  : 1.02361e-02 ± 6.48103e-04
  CSA_P2  : -5.21650e-05 ± 9.86985e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [12, 29, 37, 45, 73, 92, 120]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  5
 | P_BROKEN_FAST :  [23, 46, 58, 72, 81]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.201', '0.0975', '1.800', '0.1356', '1.799', '0.0838', '7.000', '0.7067', 1, 1, 1, 1, 1724791370.6648307]
VI_after__Init : ['1.202', '0.0974', '1.800', '0.1356', '1.800', '0.0781', '7.000', '0.7064', 1, 1, 1, 1, 1724791378.700236]
VI_at__the_End : ['1.201', '0.4923', '1.800', '0.1370', '1.799', '0.1139', '7.000', '0.7076', 1, 1, 1, 1, 1724791438.5336354]