TEST_NAME : Wafer
TEST_DATE : 24_08_27-22_44_26
OPERATOR  : Carmen S.; Irakli K.; 
SITE : GSI | SETUP : WAFER_TEST_SETUP
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ASIC_CONFIG_PARAMETERS
  HW_ADDR : 0x7 | VERS_NO : 2.2
  ASIC_ID : XA-000-09-004-014-018-018-01 | FUSED_ID : 6359364768387637537
  IC_TEMP :  -47.91 | VDDM : 1130.10 | AUX_INT :  -25.04 | CsaBias :   54.69
  CONF_FAIL_REG : 0
  CSA_BIAS : 5
  THR2_GLB : 30
  ADC_VREF_P : 58 | ADC_VREF_N : 30 | ADC_VREF_T : 128 | ADC_VREF_TR : 122
  ADC_Chi2/NDF : 1.80258e-03 / 2
  ADC_P0  : -2.50423e-02 ± 2.99246e-02
  ADC_P1  : 8.01807e-03 ± 7.04816e-04
  ADC_P2  : -4.47516e-06 ± 3.30095e-06
  CSA_Chi2/NDF : 1.33914e-04 / 2
  CSA_P0  : 5.91142e-02 ± 7.71855e-03
  CSA_P1  : 9.82965e-03 ± 5.81537e-04
  CSA_P2  : -4.39145e-05 ± 8.85612e-06
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ASIC_TEST_PARAMETERS
AMP_CAL : 250
   N_BROKEN_DISC :  7
 | N_BROKEN_FAST :  [18, 19, 37, 47, 63, 88, 92]
 | N_BROKEN_SLOW :  []
   P_BROKEN_DISC :  7
 | P_BROKEN_FAST :  [23, 76, 102, 105, 112, 114, 116]
 | P_BROKEN_SLOW :  []
ASIC_QA_category :  NOT READY for MODULE ASSEMBLY
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VI_before_Init : ['1.202', '0.1451', '1.800', '0.1474', '1.800', '0.0843', '7.000', '0.7066', 1, 1, 1, 1, 1724791466.2164965]
VI_after__Init : ['1.202', '0.1451', '1.800', '0.1474', '1.802', '0.0788', '7.000', '0.7066', 1, 1, 1, 1, 1724791474.3138816]
VI_at__the_End : ['1.201', '0.5018', '1.800', '0.1366', '1.803', '0.1098', '7.000', '0.7072', 1, 1, 1, 1, 1724791542.6475203]